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STRESSTECH - RESIDUAL STRESS

  • RESIDUAL STRESS


Product Description

 

STRESSTECH

Equipment based on X-ray diffraction and hole-drilling are offered for measuring residual stresses and retained austenite contents. X-ray stress analyzer (X-ray diffractometer) Xstress 3000 measures the stresses imposed on crystallite material by X-ray, based on the phenomenon known as Braggs Law.

Stresstech Group also offers Prism residual stress system, based on hole-drilling technique, for residual stress measurements. Prism dramatically increases the speed of data acquisition over the traditional strain gage hole-drilling technique of measuring residual stress. 

 

For more information please visit: www.stresstech.fi


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