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MITECH MFD620C PORTABLE ULTRASONIC FLAW DETECTOR

MITECH MFD620C PORTABLE ULTRASONIC FLAW DETECTOR

The MFD620C Portable Ultrasonic Flaw Detector features a high-resolution colour TFT LCD display.

Product Description

Key Features:

The MFD620C Portable Ultrasonic Flaw Detector features a high-resolution colour TFT LCD display. The background color and the wave color can be selected according to the work environment. LCD brightness can be manually set. The Battery module has a work life of over 8 hours, is easy to dismantle and can be charged independently offline.  It is light and portable with easy operation.

Range:

0~6000 mm (at steel velocity); range selectable in fixed steps or continuously variable.

Pulser:

  • Spike excitation with low, middle and high choices of the pulse energy.
  • Pulse Repetition Rate: manually adjustable from 10 to 1000 Hz.
  • Pulse width: Adjustable in a certain range to match different probes.
  • Damping: 200Ω, 300Ω, 400Ω, 500Ω, 600Ωselectable to meet different resolution and sensitivity need.
  • Probe work mode: Single element, dual element and through transmission;

Receiver:

  • Real-time sampling at 160MHz high speed enough to record the defect information.
  • Rectification: Positive half wave, negative halfwave, full wave, and RF:
  • DB Step: 0dB, 0.1 dB, 2dB, 6dB step value as well as auto-gain mode

Alarm:

Alarm with sound and light.

Memory:

Total 1000 configuration channels store all instrument operating parameters plus DAC/AVG curve; stored configuration data can be easily previewed and recalled for quick, repeatable instrument setup. Total 1000 data-sets store all instrument operating parameters plus A-scan. All the configuration channels and data-sets can be transferred to PC via USB port.

Functions:

  • Peak Hold: Automatically searching the peak wave inside the gate and hold it on the display.
  • Equivalent diameter calculation: find out the peak echo and calculate its equivalent diameter.
  • Continuous Record: Record the display continuously and save it to the memory inside the instrument.
  • Defect Localization: Localize the defect position, including the distance, the depth and its plane projection distance.
  • Defect Sizing: calculate the defect size.
  • Defect Evaluation: Evaluate the defect by echo envelope.
  • DAC: Distance Amplitude Correction.
  • AVG: Distance Gain Size curve function.
  • Crack measure: Measure and calculate the crack depth.
  • B-SCAN: Display the cross-section of the test block.

Clock:

Real time clock for tracking the time.

Communication:

USB 2.0 high-speed communication port.

Specifications:

  • Channels: 1000 channels.
  • Range: (0 ~ 6000) mm in steel.
  • Bandwidth: (0.5 ~ 15) MHz.
  • Material Velocity: (1000 ~ 15000) m / s.
  • Dynamic Range: ≥ 36 dB.
  • Vertical linear error: ≤ 2.5%.
  • Horizontal linear error: ≤ 0.1%.
  • Resolution: > 40 dB (5P14).
  • Sensitivity Leavings: 65 dB (flat-bottomed deep hole 200 mmФ2).
  • Rejection: (0 to 80)% Linear.
  • Noise level: ≤ 8%.
  • Ambient temperature: (-20 ~ 50) ℃.
  • Relative Humidity: (20 ~ 95)% RH.
  • Overall dimensions: 250 × 170 × 60(mm).
  • Weight: 1.8 kg. (Main unit with battery.

MFD650C Standard Configuration:

 

No. Item Qty.
1 Main Body. 1
2 Straight Beam Probe. 1
3 Angle Probe. 1
4 Machine-probe Cable. 1
5 Battery Module. 1
6 Power Adapter (Charger). 1
7 Support Pillar. 1
8 Manual. 1
9 Instrument Case. 1

 

For further information please email: ndt@ndt.com.au

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