The new µSCAN 600 is microcomputer based DSP Barkhausen Noise Analyser designed to expand the limits of Barkhausen Noise technique for advanced research work. It provides a wide range of user definable measurement and analysis parameters, allowing the system to adjust to virtually any test condition.

Typical applications of a µSCAN system include:

• Correlating different microstructural parameters to Barkhausen Noise
• Estimating gradients such as stress, plastic deformation, hardness, etc.
• Developing new NDT applications
• Evaluating stress and microstructure changes using several functions and parameters
• Optimising measurement conditions for the analysis
• Switching freely between real-time (Rollscan) and off-line (µScan) modes
• General research work

µSCAN 600 signal analysis is based on digitising and storing the analogue signal derived from dedicated, patented sensors. All measurement parameters are set, commands given, results calculated and displayed through a computer. User definable frequency ranges make it possible to characterize near surface gradients such as stress, plastic deformation, hardness, etc.

XSTRESS 3000 STRESS ANALYSER    

XSTRESS 3000 is a small, lightweight, accurate and safe X-ray diffractometer for measuring residual stresses and retained austenite contents. XSTRESS 3000 measures the stresses on crystalline material by X-rays, based on the phenomenon known as Bragg´s law.

XSTRESS 3000 is suitable for both laboratory and field use. As an easily portable diffractometer it makes measurements possible also in difficult conditions in the field like inside a storage tank, in a pipeline or up on a scaffolding. Despite the portability, the unit’s alignment procedure and use have been designed very much with ease of use in mind, without any loss of accuracy.

XSTRESS 3000 weighs only about 25 kg (55 lb) and can thus be easily loaded, unloaded and carried by one person. It is self contained and only requires the 110 - 240 VAC power supply. From the moment it’s unloaded until it’s ready to perform a measurement it takes only 10 minutes. Thanks to the implementation of the state of the art, patented, semiconductor detector technology the measurement time on a typical steel sample is 2 minutes or less.

The accuracy of the measurement using the XSTRESS 3000 is comparable with large stationary laboratory X-ray diffractometers. It is easy to use yet it is so sophisticated that it will satisfy a most demanding researcher. The software, X3000 allows access to all the test parameters and measurement data at any stage of the measurement routine.

XSTRESS 3000 consists of the:

• XSTRESS 3000 Central unit
• Goniometer
• X3000 Software

For more information on Stresstech see www.stresstech.fi